Building Filters
HIGH VOLTAGE INSULATION TESTER IR5051
- Fabricante: HIOKI E.E
Measurement parameters: • Insulation resistance • PV insulation resistance • Leakage current • Voltage • Capacitance (DD function) | Max. rated voltage to terminals: 1000 V AC, 2000 V DC | Max. rated voltage to g...
Nagano, JapónFLYING PROBE TESTER FA1815-20
Number of arms: 4 (2 each, top and bottom) | Compatible probes: 1172 series, CP1072 series, CP1073 series | Number of test steps: Max. 4,000,000 steps | Test parameters and measurement ranges: DC constant-current...
Nagano, JapónHIGH VOLTAGE INSULATION TESTER IR5050
- Fabricante: HIOKI E.E
Measurement parameters: • Insulation resistance • Leakage current • Voltage • Capacitance (DD function) | Max. rated voltage to terminals: 1000 V AC, 2000 V DC | Max. rated voltage to ground: 1000 V (CAT IV), 600...
Nagano, JapónINSULATION TESTER IR4059
- Fabricante: HIOKI E.E
Rated output voltage: 50 V DC | Effective maximum indicated value: 100 MΩ | Accuracy 1st effective measuring range mω: ±2 % rdg. ±2 dgt. 0.200 - 10.00 | Lower limit resistance: 0.05 MΩ | Overload protection: 600...
Nagano, JapónMEMORY HiCORDER MR8848
Measurement functions: Memory function (waveform recording), Recorder function (peak/trough recording), X-Y Recorder function, FFT function | Max. number of channels: 16 ch analog + 16 ch logic 32 ch analog + 16 ...
Nagano, JapónEARTH TESTER FT6041
- Fabricante: HIOKI E.E
measurement parameters: • Ground resistance measurement: 4-pole method, 3-pole method, 2-pole method, MEC function, clamp-on measurement (two clamps) • Soil resistivity measurement: 4-pole method • Low-resistanc...
Nagano, JapónPARTIAL DISCHARGE DETECTOR ST4200
Detection method: Discharge current detection using a CT and digital filter in compliance with IEC 61934 Edition 2.0 and IEC 60034-27-5 | Test frequency range (applied voltage): 45 Hz to 1.1 kHz | Charge quantity...
Nagano, JapónSHORT-OPEN TESTER FA1221
- Fabricante: HIOKI E.E
Number of test points: 128 pins (during 4-terminal measurement, up to 32 sets) | Number of test steps: Round-robin short/open : 128 pins Component data : Max. 10000 steps Charge data : 40 sets Pin contact data : ...
Nagano, JapónINSULATION TESTER ST5520
- Fabricante: HIOKI E.E
Measurement items: Insulation resistance (Applied DC voltage method) | Testing voltage: (Measurement range: AUTO/MANUAL setting is possible) 25 V ≤ V < 100 V (2.000/20.00/200.0 MΩ), 100 V ≤ V < 500 V (2.000/20.0...
Nagano, JapónIMPULSE WINDING TESTER ST4030A
- Fabricante: HIOKI E.E
Measurement items: • Quantification (LC value, RC value) of the response waveform obtained when impulse voltage is applied, pass / fail judgment • Waveform judgment using AREA value, Flutter, Laplacian etc. • Equ...
Nagano, JapónIN-CIRCUIT TESTER FA1220
- Fabricante: HIOKI E.E
Number of test points: Max. 1024 pins (Can be added in blocks of 128 pins.) Standard : 0 pins (Scanner boards are sold as options.) | Number of test steps: Round-robin short/open data : 1024 pins Component data :...
Nagano, JapónSAFETY TEST DATA MANAGEMENT SOFTWARE 9267
Compatible models: ST5520*, ST5540/ST5541, 3153, 3154, 3156, 3157, 3158, 3159, 3174, 3332, 3333, 3334, and PLCs from various manufacturers (for connection switching) *Control of the ST5520 is subject to certain l...
Nagano, JapónIN-CIRCUIT TESTER FA1220-11
- Fabricante: HIOKI E.E
Number of test points: Standard: 0 pins (scanner boards optional) Max. 2048 pins (expandable in blocks of 128 pins)* * The maximum number of active pins for each test type depends on the total number of scanner b...
Nagano, JapónINSULATION TESTER IR4053
- Fabricante: HIOKI E.E
Rated output voltage: 50 V DC | Effective maximum indicated value: 100 MΩ | Measuring range/ accuracy: 0.200 to 500 MΩ / ±4% rdg. 501 to 2000 MΩ / ±8% rdg. | Other measuring range / accuracy: 0 to 0.199 MΩ / ±2%...
Nagano, JapónIN-CIRCUIT TESTER FA1220-02
- Fabricante: HIOKI E.E
Number of test points: Standard: 0 pins (scanner boards optional) Max. 2048 pins (expandable in blocks of 128 pins)* * The maximum number of active pins for each test type depends on the total number of scanner b...
Nagano, Japón