Usado test instrumente en Nagano, Prefectura de Nagano, Japón

LUX METER FT3425

Standards: DIN 5032-7: 1985 class B, JIS C 1609-1: 2006 general AA class | Light receiving element: Silicon photo diode | Range selection: Auto/ Manual | Linearity: ±2% rdg. (Multiply by 1.5 for display values i...

CURRENT PROBE CT6710

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 50 MHz (-3 dB) | Rise time: 7.0 ns or shorter | Delay time (typical): 30 A range: 12 ns, 5 A range: 12 ns, 0.5 A range: 13 ns (Delay time relative to rising waveform of input signal 1...

CURRENT PROBE CT6711

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 120 MHz (-3 dB) | Rise time: 2.9 ns or shorter | Delay time (typical): 30 A range: 12 ns, 5 A range: 12 ns, 0.5 A range: 13 ns (Delay time relative to rising waveform of input signal ...

CURRENT PROBE CT6701

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 120 MHz (-3 dB) | Rise time: 2.9 ns or shorter | Noise level: 60 μA rms typical, 75 μA rms max (for 30 MHz band measuring instrument) | Continuous allowable input: 5 A rms (DC, and sine...

CLAMP ON PROBE 3274

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 10 MHz (-3 dB) | Rise time: 35 ns or shorter | Noise level: 25 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 150 A rms (requires derating at frequency) | Max. ...

IMPEDANCE ANALYZER IM3570

Measurement modes: LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode | Measurement parameters: Z, Y, θ, Rs (ESR), Rp, Rdc (DC resistance), X, G, B, Cs,...

CLAMP ON PROBE 3276

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 100 MHz (-3 dB) | Rise time: 3.5 ns or shorter | Noise level: 2.5 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 30 A rms (requires derating at frequency) | Max...

CLAMP ON PROBE 3275

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 2 MHz (-3 dB) | Rise time: 175 ns or shorter | Noise level: 25 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 500 A rms (requires derating at frequency) | Max. ...

AC/DC CURRENT SENSOR CT6876A

Rated current: 1000 A AC/DC | Max. allowable input: Within the derating range, up to ±1800 Apeak (design value) allowed at 40°C or less for 20 ms or less | Frequency bandwidth: Amplitude: DC to 1.5 MHz (CT6876A),...

AC/DC CURRENT SENSOR CT6872

Rated current: 50 A AC/DC | Max. allowable input: Within the derating range, up to ±150 A peak (design value) allowed at 40°C or less for 20 ms or less | Frequency bandwidth: Amplitude: DC to 10 MHz Phase: DC to ...

AC/DC CURRENT SENSOR CT6873

Rated current: 200 A AC/DC | Max. allowable input: Within the derating range, up to ±420 A peak (design value) allowed at 40°C or less for 20 ms or less | Frequency bandwidth: Amplitude: DC to 10 MHz Phase: DC to...

AC/DC CURRENT SENSOR CT6877A

Rated current: 2000 A AC/DC | Max. allowable input: Within the derating range, (within the specified range up to ±3200 Apeak ) | Frequency characteristics: Amplitude: DC to 1 MHz, Phase: DC to 700 kHz | Basic acc...

CLAMP ON PROBE 3273-50

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 50 MHz (-3 dB) | Rise time: 7 ns or shorter | Noise level: 2.5 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 30 A rms (requires derating at frequency) | Max. a...

LCR METER IM3536

Measurement modes: LCR (Measurement with single condition), Continuous testing (Continuous measurement under saved conditions) | Measurement parameters: Z, Y, θ, X, G, B, Q, Rdc (DC resistance), Rs (ESR), Rp, Ls,...

AC/DC CURRENT SENSOR CT6875A

Rated current: 500 A AC/DC | Max. allowable input: Within the derating range, up to ±1500 Apeak (design value) allowed at 40°C or less for 20 ms or less | Frequency bandwidth: Amplitude: DC to 2 MHz (CT6875A), DC...