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BATTERY INSULATION TESTER BT5525
- Fabricante: HIOKI E.E
Main functions: Insulation resistance test Break Down Detect function (BDD) Contact check function | Output specifications: Output voltage : 25 V to 500 V, Setting resolution 1 V Charging current (Current limit ...
Nagano, JapónSWITCH MAINFRAME SW1002
Slots: 12 slots | Supported modules: MULTIPLEXER MODULE SW9001 (2-wire/4-wire) MULTIPLEXER MODULE SW9002 (4-terminal pair) | Connectible instruments: Max. 2 units 2-wire × 1 + 4-wire × 1, or 2-wire × 1 + 4-termin...
Nagano, JapónSWITCH MAINFRAME SW1001
Slots: 3 slots | Supported modules: MULTIPLEXER MODULE SW9001 (2-wire/4-wire) MULTIPLEXER MODULE SW9002 (4-terminal pair) | Connectible instruments: Max. 2 units 2-wire × 1 + 4-wire × 1, or 2-wire × 1 + 4-termina...
Nagano, JapónPRECISION DC VOLTMETER DM7276
Dc voltage: 100 mV ( ±120.000 00 mV) to 1000 V ( ±1000.000 0 V ), 5 ranges | Basic accuracy: 10 V range: ±0.0009% rdg. ±12 μV | Temperature: -10.0°C to 60.0°C (14.0°F to 140°F), combined with sensor Z2001: ±0.5°C...
Nagano, JapónPRECISION DC VOLTMETER DM7275
Dc voltage: 100 mV ( ±120.000 00 mV) to 1000 V ( ±1000.000 0 V ), 5 ranges | Basic accuracy: 10 V range: ±0.0020% rdg. ±12 μV | Temperature: -10.0°C to 60.0°C (14.0°F to 140°F), combined with sensor Z2001: ±0.5°C...
Nagano, JapónCARD HiTESTER 3244-60
Dc voltage range: 419.9 mV to 500 V, 5 ranges, Basic accuracy: ±0.7 % rdg. ±4 dgt. | Ac voltage range: 4.199 V to 500 V, 4 ranges, Basic accuracy 50 - 500 Hz : ±2.3 % rdg. ±8 dgt. (Average rectified) | Resistanc...
Nagano, JapónGENNECT CROSS SF4071, SF4072
- Fabricante: HIOKI E.E
Bluetooth(r) connection: Bluetooth(R) LE | Os which gennect cross can be installed: SF4071: iOS 10.0 or later, iPadOS 13.0 or later SF4072: Android TM 5.0 or later | Measurement data management: Local, e-mail /...
Nagano, JapónWIRELESS ADAPTER Z3210
- Fabricante: HIOKI E.E
Operating environment: Indoors, pollution degree 2, operable at an altitude specified in specifications of each measuring instrument to which the adapter is attached | Operating temperature and humidity (storage ...
Nagano, JapónLUX METER FT3424
Standards: DIN 5032-7: 1985 class B, JIS C 1609-1: 2006 general AA class | Light receiving element: Silicon photo diode | Range selection: Auto/ Manual | Linearity: ±2% rdg. (Multiply by 1.5 for display values i...
Nagano, JapónAC/DC CURRENT PROBE CT6841A
Rated current: 20 A AC/DC | Frequency bandwidth: DC to 2 MHz | Diameter of measurable conductors: Max. φ 20 mm (0.79 in.) | Max. allowable input: ±60 A peak (Within 20 ms in an environment of 40°C/104°F or less)...
Nagano, JapónAC/DC CURRENT PROBE CT6844A
Rated current: 500 A AC/DC | Frequency bandwidth: DC to 500 kHz | Diameter of measurable conductors: Max. φ 20 mm (0.79 in.) | Max. allowable input: ±800 A peak (Within 20 ms in an environment of 40°C/104°F or le...
Nagano, JapónAC/DC CURRENT PROBE CT6843A
Rated current: 200 A AC/DC | Frequency bandwidth: DC to 700 kHz | Diameter of measurable conductors: Max. φ 20 mm (0.79 in.) | Max. allowable input: ±600 A peak (Within 20 ms in an environment of 40°C/104°F or le...
Nagano, JapónAC/DC CURRENT PROBE CT6845A
Rated current: 500 A AC/DC | Frequency bandwidth: DC to 200 kHz | Diameter of measurable conductors: Max. φ 50 mm (1.97 in.) | Max. allowable input: ±1500 A peak (Within 20 ms in an environment of 40°C/104°F or ...
Nagano, JapónAC/DC CURRENT PROBE CT6846A
Rated current: 1000 A AC/DC | Frequency bandwidth: DC to 100 kHz | Diameter of measurable conductors: Max. φ 50 mm (1.97 in.) | Max. allowable input: ±1900 Apeak (Within 20 ms in an environment of 40°C/104°F or l...
Nagano, JapónCHEMICAL IMPEDANCE ANALYZER IM3590
Measurement modes: LCR mode, Continuous measurement mode (LCR mode / Analyzer mode), Analyzer mode (Sweeps with measurement frequency and measurement level, temperature characteristics, equivalent circuit analysi...
Nagano, Japón