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GENNECT CROSS SF4071, SF4072
- Fabricante: HIOKI E.E
Bluetooth(r) connection: Bluetooth(R) LE | Os which gennect cross can be installed: SF4071: iOS 10.0 or later, iPadOS 13.0 or later SF4072: Android TM 5.0 or later | Measurement data management: Local, e-mail /...
Nagano, JapónGENNECT Cloud SF4180
- Fabricante: HIOKI E.E
Monitor function: Collect and save GENNECT polled data (logged at a 1 min. interval) and display it in real time. | Drive functionality: Manage and export GENNECT polled data and instrument data fi les. | Alarm f...
Nagano, JapónWIRELESS ADAPTER Z3210
- Fabricante: HIOKI E.E
Operating environment: Indoors, pollution degree 2, operable at an altitude specified in specifications of each measuring instrument to which the adapter is attached | Operating temperature and humidity (storage ...
Nagano, JapónAC/DC CURRENT PROBE CT6831
- Fabricante: HIOKI E.E
Rated measurement current: 20 A AC/DC | Max. allowable input: 30 A rms continuous (±43 Ap) | Bandwidth: DC to 100 kHz | Basic accuracy: DC± 0.3% rdg. ±0.1% f.s. | Core diameter: φ 5 mm or less | Output connectors...
Nagano, JapónAC/DC CURRENT PROBE CT6830
- Fabricante: HIOKI E.E
rated measurement current: 2 A AC/DC | Max. allowable input: 3 A rms continuous (±4.3 Ap) | Bandwidth: DC to 100 kHz | Basic accuracy: DC± 0.3% rdg. ±0.1% f.s. | Core diameter: φ 5 mm or less | Output connectors...
Nagano, JapónPARTIAL DISCHARGE DETECTOR ST4200
Detection method: Discharge current detection using a CT and digital filter in compliance with IEC 61934 Edition 2.0 and IEC 60034-27-5 | Test frequency range (applied voltage): 45 Hz to 1.1 kHz | Charge quantity...
Nagano, JapónPOWDER IMPEDANCE MEASUREMENT SYSTEM
Frequency at which measurements can be made: DC to 5 MHz (Three types of measuring instruments used) | Load application method: Manual operation (constant control of load is not possible) | Load range (compressin...
Nagano, JapónSMD TEST FIXTURE IM9100
Measurement terminals: Four terminal direct connection type, BNC terminals | Connecting section: Four terminal type | Measurable sample sizes: Metric (Inch): 0402 (01005), 0603 (0201), 1005 (0402) | Allowable inp...
Nagano, JapónSMD TEST FIXTURE IM9110
Connection with sample: 2-terminal connection from opposite sides | Measurable sample sizes: 0.25 ±20% × 0.125 ±10% × 0.125 ±10% mm (EIA size category: 008004 inch) Please contact Hioki for information about othe...
Nagano, JapónAC/DC CURRENT PROBE CT6833, CT6833-01
Rated current: 200 A AC/DC | Frequency bandwidth: DC to 50 kHz | Diameter of measurable conductor: Max. φ20 mm (0.79 in.) | Maximum peak current: Up to ±600 A peak are permitted at a temperature of 40°C (104°F) o...
Nagano, JapónAC/DC CURRENT PROBE CT6834, CT6834-01
Rated current: 500 A AC/DC | Frequency bandwidth: DC to 50 kHz | Diameter of measurable conductor: Max. φ20 mm (0.79 in.) | Maximum peak current: Up to ±800 A peak are permitted at a temperature of 40°C (104°F) o...
Nagano, JapónRESISTANCE METER RM3545A
resistance range (13 ranges): [Range, Maximum display value, Resolutions, Testing current (Measurement current) ] 1000 μΩ: 1200.000 μΩ, 1 nΩ, 1 A 10 mΩ: 12.000 00 mΩ, 10 nΩ, 1 A 100 mΩ: 120.000 0 mΩ, 100 nΩ, 1 A...
Nagano, JapónRESISTANCE HiTESTER RM3543
Measurement method: Four-terminal, constant-current DC | Resistance range: 10 mΩ (Max. 12.00000 mΩ, 0.01 μΩ resolution) to 1000 Ω range (Max. 1200.000 Ω, 1 mΩ resolution), 7 steps | Display: Monochrome graphic LC...
Nagano, JapónRESISTANCE HiTESTER RM3542
Resistance range: [at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 10 steps [at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resol...
Nagano, JapónRESISTANCE METER RM3542A
Resistance range: [at Low Power OFF] 100 mΩ range (Max. 120.0000 mΩ, 0.1 μΩ resolution) to 100 MΩ range (Max. 120.0000 MΩ, 100 Ω resolution), 16 steps [at Low Power ON] 1000 mΩ range (Max. 1200.000 mΩ, 1 μΩ resol...
Nagano, Japón