Usado controllers en Nagano, Japón

CLAMP ON PROBE 3274

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 10 MHz (-3 dB) | Rise time: 35 ns or shorter | Noise level: 25 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 150 A rms (requires derating at frequency) | Max. ...

CURRENT PROBE CT6710

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 50 MHz (-3 dB) | Rise time: 7.0 ns or shorter | Delay time (typical): 30 A range: 12 ns, 5 A range: 12 ns, 0.5 A range: 13 ns (Delay time relative to rising waveform of input signal 1...

CURRENT PROBE CT6711

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 120 MHz (-3 dB) | Rise time: 2.9 ns or shorter | Delay time (typical): 30 A range: 12 ns, 5 A range: 12 ns, 0.5 A range: 13 ns (Delay time relative to rising waveform of input signal ...

CLAMP ON PROBE 3276

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 100 MHz (-3 dB) | Rise time: 3.5 ns or shorter | Noise level: 2.5 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 30 A rms (requires derating at frequency) | Max...

CURRENT PROBE CT6701

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 120 MHz (-3 dB) | Rise time: 2.9 ns or shorter | Noise level: 60 μA rms typical, 75 μA rms max (for 30 MHz band measuring instrument) | Continuous allowable input: 5 A rms (DC, and sine...

CURRENT PROBE CT6700

Frequency bandwidth: DC to 50 MHz (-3 dB) | Rise time: 7.0 ns or shorter | Noise level: 60 μA rms typical, 75 μA rms max (for 30 MHz band measuring instrument) | Continuous allowable input: 5 A rms (DC, and sine ...

CLAMP ON PROBE 3273-50

• Fabricante: HIOKI E.E

Frequency bandwidth: DC to 50 MHz (-3 dB) | Rise time: 7 ns or shorter | Noise level: 2.5 mA rms max. (bandwidth limited to 20 MHz) | Continuous allowable input: 30 A rms (requires derating at frequency) | Max. a...